Wavefront sensing based on rotated lateral shearing interferometry

Optics Communications, Volume 281, Issue 2, 15 Jan 2008, 210-216. doi:10.1016/j.optcom.2007.09.025 M. Schwertner, M. J. Booth & T. Wilson

We describe a self-referencing method of wavefront sensing based on rotated lateral shearing interferometry which is able to measure the local slope of a wavefront. We describe the principle of operation, suggest a number of practical implementations, and present experimental results. We found the difference between two sequential measurements of a nominally flat wavefront to be better than k/250 root mean square.

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